Titre: The Next Wave of Mixed-Signal Interface Electronics
Conférencier: Boris Murmann , Université Stanford, É.-U.
Lieu: École Polytechnique de Montréal, Pavillon Lassonde, L-2708 ,
Date et heure:
jeudi le 28 mars 2013 de 09:00 à 12:00


1) Noise analysis in switched-capacitor circuits
Switched-capacitor (SC) circuits are ubiquitous in CMOS mixed-signal ICs. The most fundamental performance limitation in these circuits stems from the thermal noise introduced by MOSFET switches and active amplifier circuitry. This tutorial reviews hand analysis techniques that allow the designer to predict the noise performance of switched-capacitor circuits at various levels of complexity. The material presented in this talk focuses on practical examples ranging from basic passive and active track-and-hold circuits, integrators and SC delta-sigma modulators. Simulation examples are included to complement and verify the theoretical treatment.

2) Energy limits in A/D converters
Driven by ever-increasing application demands, the energy expended per A/D conversion has been reduced substantially over the last decade. This presentation will survey the most recent trends and will investigate energy limits as they apply to A/D converter architectures commonly employed in fine-line CMOS technology (Flash, Pipeline, SAR and Oversampling Converters). Through this analysis, opportunities for further improvements will be identified and discussed in detail, including the impact of technology scaling.

3) Research overview, Murmann mixed-signal group
In most modern electronic systems, information is processed and stored in digital format. However, analog interfaces are still necessary to interface with “real world” signals and often present a bottleneck in the overall system. This presentation will provide an overview of recent advances and trends in the design of analog-digital interface circuits from an application standpoint. It will include examples from the areas of data communication, micro-electromechanical systems (MEMS), bio-medical instrumentation, structural health monitoring, and large-area electronics.

Note biographique: Boris Murmann is an Associate Professor in the Department of Electrical Engineering, Stanford, CA. He received the Ph.D. degree in electrical engineering from the University of California at Berkeley in 2003. From 1994 to 1997, he was with Neutron Mikrolektronik, Germany, where he developed low-power and smart-power ASICs in automotive CMOS technology. Dr. Murmann’s research interests are in the area of mixed-signal integrated circuit design, with special emphasis on data converters and sensor interfaces. In 2008, he was a co-recipient of the Best Student Paper Award at the VLSI Circuits Symposium in 2008 and a recipient of the Best Invited Paper Award at the IEEE Custom Integrated Circuits Conference (CICC). He received the Agilent Early Career Professor Award in 2009 and the Friedrich Wilhelm Bessel Research Award in 2012. He currently serves as an Associate Editor of the IEEE Journal of Solid-State Circuits, the Data Converter Subcommittee Chair of the IEEE International Solid-State Circuits Conference (ISSCC) and as a program committee member of the European Solid-State Circuits Conference (ESSCIRC). He is an elected AdCom member of the IEEE Solid-State Circuits Society.

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