Thibeault, Claude

Method for designing, validating, verifying and testing/diagnosing digital systems

Part 1: Integrated Circuit Testing and Diagnostics. The main objective of this part at the test level is to develop a viable alternative to IDDQ testing, the effectiveness of which decreases with the scaling down of CMOS technologies. The strategy used is based on post-processing of usual steady-state current measurements. On the diagnostic side, the objective is to develop techniques, combining post-processing of IDDQ measurements and other sources of information, to identify and localize defects.

Section 2: Digital Design for Signal Processing. This involves the development and implementation of algorithms dedicated to digital signal processing. The targeted applications are telecommunications, GPS systems, and video signals.

Section 3: Design methodology for systems tolerant to faults caused by cosmic radiation. The main objective of this section is the adaptation of traditional design flows to the addition of robustness specification related to fault tolerance.

Component 4: Design methodology for highly programmable and reconfigurable systems. The main objective of this component is the development of tools used upstream of the design flows in order to estimate the capacity of the targeted platforms to achieve the intended specifications.